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电信和无线电工程
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 打印: 0040-2508
ISSN 在线: 1943-6009

卷:
卷 78, 2019 卷 77, 2018 卷 76, 2017 卷 75, 2016 卷 74, 2015 卷 73, 2014 卷 72, 2013 卷 71, 2012 卷 70, 2011 卷 69, 2010 卷 68, 2009 卷 67, 2008 卷 66, 2007 卷 65, 2006 卷 64, 2005 卷 63, 2005 卷 62, 2004 卷 61, 2004 卷 60, 2003 卷 59, 2003 卷 58, 2002 卷 57, 2002 卷 56, 2001 卷 55, 2001 卷 54, 2000 卷 53, 1999 卷 52, 1998 卷 51, 1997

电信和无线电工程

DOI: 10.1615/TelecomRadEng.v70.i17.70
pages 1579-1591

APPLICATION OF THE SPECTRAL INTERFEROMETRY METHOD FOR MICRO-AND NANODISTANCE MEASUREMENT

K. A. Lukin
A.Ya. Usikov Institute for Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkiv 61085, Ukraine
Yu. P. Machekhin
Kharkiv National University of Radio Electronics, 14 Nauka Ave, Kharkiv 61166, Ukraine
M.B. Danailow
Laser Laboratory, Synchrotron, SS14, km.163.5, 34012, Trieste, Italy
D. N. Tatyanko
A. Usikov Institute of Radio Physics and Electronics,National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkiv 61085, Ukraine

ABSTRACT

The result of the investigations into the optical interferometry using the low-coherent radiation sources beyond the coherence zone are presented. It is shaven that when the difference in the Michelson interferometer arms exceeds the coherence length of a light-emitting diode (LED) radiation, the spectral interference phenomenon may well be utilized to make measurements of micro- and nanodistances depending upon the delay time and the relative phase between the reference and probing signals.


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