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电信和无线电工程
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 打印: 0040-2508
ISSN 在线: 1943-6009

卷:
卷 78, 2019 卷 77, 2018 卷 76, 2017 卷 75, 2016 卷 74, 2015 卷 73, 2014 卷 72, 2013 卷 71, 2012 卷 70, 2011 卷 69, 2010 卷 68, 2009 卷 67, 2008 卷 66, 2007 卷 65, 2006 卷 64, 2005 卷 63, 2005 卷 62, 2004 卷 61, 2004 卷 60, 2003 卷 59, 2003 卷 58, 2002 卷 57, 2002 卷 56, 2001 卷 55, 2001 卷 54, 2000 卷 53, 1999 卷 52, 1998 卷 51, 1997

电信和无线电工程

DOI: 10.1615/TelecomRadEng.v69.i18.80
pages 1673-1680

AUTOMATED STAND FOR MEASURING OF ANISOTROPIC CRYSTAL PARAMETERS WITHIN THE MICROWAVE BAND

A. V. Strizhachenko
V. Karazin National University of Kharkov, 4, Svoboda Sq., Kharkov, 61077, Ukraine

ABSTRACT

It is developed a measuring stand, providing along with the developed software for performing measurements and statistically processing the results of measurements of the permittivity tensor components and dielectric losses of single‐axis crystals with a tetragonal type of symmetry in the microwave band without destroying the measured objects. The measurement error while measuring permittivity of isotropic dielectrics is about 1%, the permittivity tensor components − is not exceeding 3%, the dielectric loss factor − of 15%. The sensitivity to variation of the permittivity value (depending upon the bandwidth) is 400 to 800 МHz per unit of ε.

REFERENCES

  1. Shestopalov, V.P., Кirilenko, А.А., and Rud, L.А., Resonant scattering of waves. Waveguide heterogeneities.

  2. Strizhachenko, A., Zvyagintsev, A., and Сhizhov, V., Electrodinamics of Waveguide Junctions with Anisotropic Filling.

  3. Sirotin, Yu. and Shaskolskaya, М., Elementary of the Physics of Crystals.

  4. Strizhachenko, A., Zvyagintsev, A., and Сhizhov, V., Measurement of Electrical Parameters of Uniaxial and Biaxial Crystals.

  5. Yegorov, V.N. and Коstromin, V.V., Меthodology of State system for ensuring the uniformity of measurements.


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