RT Journal Article ID 2b7b0e101ffab011 A1 Lukin, K. A. A1 Machekhin, Yu. P. A1 Danailow , M.B. A1 Tatyanko, D. N. T1 APPLICATION OF THE SPECTRAL INTERFEROMETRY METHOD FOR MICRO-AND NANODISTANCE MEASUREMENT JF Telecommunications and Radio Engineering JO TRE YR 2011 FD 2011-12-12 VO 70 IS 17 SP 1579 OP 1591 K1 spectral interferometry K1 light-emitting diode K1 noise optical signal K1 Michelson interferometer AB The result of the investigations into the optical interferometry using the low-coherent radiation sources beyond the coherence zone are presented. It is shaven that when the difference in the Michelson interferometer arms exceeds the coherence length of a light-emitting diode (LED) radiation, the spectral interference phenomenon may well be utilized to make measurements of micro- and nanodistances depending upon the delay time and the relative phase between the reference and probing signals. PB Begell House LK https://www.dl.begellhouse.com/journals/0632a9d54950b268,225250254f0b75b3,2b7b0e101ffab011.html