RT Journal Article
ID 3a014bf175d0a658
A1 Barannik, A. A.
A1 Prokopenko, Yu. V.
A1 Filippov, Yu. F.
A1 Cherpak, Nikolay T.
T1 Application of Quasi-Optical Dielectric Cavity Resonators for Measuring Microwave Characteristics of Dielectric and Conducting Materials
JF Telecommunications and Radio Engineering
JO TRE
YR 2001
FD 2001-12-01
VO 55
IS 12
OP 10
AB Approaches are developed to studying microwave characteristics of dielectric and conducting materials with the use of quasi-optical dielectric resonators whose axis coincides with the anisotropy axis of the dielectric. The technique is based on the solving a characteristic set of equations that involve measured values of the resonator's eigen-frequencies, and identifying the eigenmodes observed in the resonator, as well as using measured magnitudes of the resonator Q-factor in the power relations derived. Examples are presented of implementating the approaches to determine components of the tensorial dielectric constant, [<i>&#949;<sub>ij</sub></i>], and the loss tangent, tan <i>&delta;</i>, of dielectric materials, and also to estimate the surface resistance, <i>R<sub>s</sub></i>, of conducting end plates of the cylindrical resonator. Spectral characteristics and power relations of the higher order <i>HE<sub>nsm</sub></i> modes are investigated for the radial in dices <i>s</i> = 1 and 2. The method suggested to analyze quasioptical resonators are of interest for studying dielectric materials and measuring the surface resistances, <i>R<sub>s</sub></i>, of conductors and superconductors at millimeter wavelengths.
PB Begell House
LK https://www.dl.begellhouse.com/journals/0632a9d54950b268,094e6e2657aa6e79,3a014bf175d0a658.html