Erscheint 4 Ausgaben pro Jahr
ISSN Druckformat: 2152-274X
ISSN Online: 2152-2758
DETERMINATION OF LAYERED STRUCTURE PARAMETERS BY A SCATTERING MATRIX RECOVERED FROM KNOWN REFLECTION COEFFICIENTS
ABSTRAKT
A new method for determining both layers' permittivity and thickness of a plane layered structure is proposed. The reflection coefficient of a plane electromagnetic wave is considered as the problem's given data. The method employs an approach to reconstruction of the frequency dependences of all scattering matrix elements in a limited waveband. The scattering matrix has been recovered by recalculation of the reflection coefficients measured for this structure in free space and on a perfectly-conducting substrate. A high accuracy in both permittivity and thickness determination is achieved due to identification of spectral factors which are singled out from the scattering matrix elements and expressed as a finite series of continuous complex exponents.