Publicado 4 números por año
ISSN Imprimir: 1093-3611
ISSN En Línea: 1940-4360
Indexed in
THE INFLUENCE OF COPPER ON MICROSTRUCTURE AND CATALYTIC PROPERTIES OF CEO2 THIN FILMS DEPOSITED BY PULSED LASER DEPOSITION
SINOPSIS
Thin films of cerium dioxide doped with Cu were elaborated by Pulsed Laser Deposition technique from sintered Cu-CeO2 targets. The films were deposited on (100) oriented Si substrates. Scanning and Transmission Electron Microscopy, as well as x-ray diffraction analyses showed correlation between a copper atom fractions and crystalline structure of (Cu, Ce)O2 thin films. As demonstrated by x-ray diffraction analysis, when the quantity of Cu increases, the (Cu,Ce)O2 thin films manufactured by laser ablation show a change of the crystal growth preferential orientation (c-axis-orientation) from strong <111> to a strong <200> ones. Infrared Spectrometry showed that, the change of the copper doped ceria crystals (Cu,Ce)O2 texture has a significant influence on their catalytic behaviour with CH4.
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Chmielowska M., Villain S., Kopia A., Dallas J.P., Kusinski J., Gavarri J.R., Leroux Ch., Ce1−xNdxO2−δ/Si thin films obtained by pulsed laser deposition: Microstructure and conduction properties, Thin Solid Films, 516, 12, 2008. Crossref