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Radio Physics and Radio Astronomy

Publicado 4 números por año

ISSN Imprimir: 2152-274X

ISSN En Línea: 2152-2758

DETERMINATION OF LAYERED STRUCTURE PARAMETERS BY A SCATTERING MATRIX RECOVERED FROM KNOWN REFLECTION COEFFICIENTS

Volumen 2, Edición 1, 2011, pp. 47-62
DOI: 10.1615/RadioPhysicsRadioAstronomy.v2.i1.50
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SINOPSIS

A new method for determining both layers' permittivity and thickness of a plane layered structure is proposed. The reflection coefficient of a plane electromagnetic wave is considered as the problem's given data. The method employs an approach to reconstruction of the frequency dependences of all scattering matrix elements in a limited waveband. The scattering matrix has been recovered by recalculation of the reflection coefficients measured for this structure in free space and on a perfectly-conducting substrate. A high accuracy in both permittivity and thickness determination is achieved due to identification of spectral factors which are singled out from the scattering matrix elements and expressed as a finite series of continuous complex exponents.

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