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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN Imprimer: 0040-2508
ISSN En ligne: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v57.i8-9.130
8 pages

Effect of Heterogeneity Parameters of Conducting Microstructures of Integrated Circuits on the Wunsch-Bell Curve

Ye. P. Taran
A.Ya. Usikov Institute for Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkiv 61085; Tavriya National University, 4, Vernadskogo ave., Simpheropol, 95007, Ukraine
V. V. Starostenko
Tavriya National University, 4, Vernadskogo ave., Simpheropol, 95007, Ukraine
Ye. V. Grigor'ev
Tavriya National University, Yaltinskaya 4, Simpheropol, 95022, Ukraine

RÉSUMÉ

On the strength of the numerical model of the pulse electromagnetic field impact on the microelectronic 1C, the impulse-duration dependences of specific threshold power (the Wunsch-Bell curve) have been obtained for microregions of heterogeneous conducting film. The influence of geometric dimensions of heterogeneous microregions on the threshold intensity value of the pulse electromagnetic field has been revealed.


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