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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN Imprimer: 0040-2508
ISSN En ligne: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v64.i11.70
pages 939-958

On the Reasons for Noises in Cross-Field Devices

A. V. Gritsunov
Kharkov National University of Radio Engineering and Electronics, 14, Lenin Ave, Kharkov, 61166, Ukraine

RÉSUMÉ

The causes of noises in both static and the dynamic modes of the cross-field devices (CFD) are investigated using the method of computing experiments. In the static mode they are: the tangential eigenmode oscillations of the electron cloud; the secondary emission bunching of the core; the solitons in the electron flux. In the dynamic mode they are the transient and the stable convective clouds in the electron spokes. An influence of the abovementioned instabilities on the electron flux oscillation spectra in CFD is considered.


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