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Telecommunications and Radio Engineering

ISSN Print: 0040-2508
ISSN Online: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v71.i1.80
pages 77-84

STATISTICAL MODELS OF THE CRITERION LEVELS OF SEMICONDUCTOR DEVICES ELECTROMAGNETIC KILL

G. N. Ovchinnikov
Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation
I. A. Syrbu
Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation
V. V. Shcherenkov
Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation
Yu. V. Yakovlev
Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation
A. P. Yarygin
Federal State Scientific-Research Testing Center of Electronic Warfare and Evaluation of Concealment Decrease, Voronezh, Russian Federation

ABSTRACT

A statistical model of the distribution of criterion energy levels of microwave pulse emissions, ensuring unrecoverable injury of input semiconductor devices in microwave receivers, is proposed. Methods for computing the probability of the functional kill of radioelectronic devices are developed; feasible functional kill distances for typical values of the microwave pulse transmitter energy potential, microwave path characteristics and the typical law of distribution of the criterion levels of semiconductor devices are evaluated.