Library Subscription: Guest
Begell Digital Portal Begell Digital Library eBooks Journals References & Proceedings Research Collections
Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN Print: 0040-2508
ISSN Online: 1943-6009

Volumes:
Volume 77, 2018 Volume 76, 2017 Volume 75, 2016 Volume 74, 2015 Volume 73, 2014 Volume 72, 2013 Volume 71, 2012 Volume 70, 2011 Volume 69, 2010 Volume 68, 2009 Volume 67, 2008 Volume 66, 2007 Volume 65, 2006 Volume 64, 2005 Volume 63, 2005 Volume 62, 2004 Volume 61, 2004 Volume 60, 2003 Volume 59, 2003 Volume 58, 2002 Volume 57, 2002 Volume 56, 2001 Volume 55, 2001 Volume 54, 2000 Volume 53, 1999 Volume 52, 1998 Volume 51, 1997

Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v60.i789.170
12 pages

Excitation of Surface Electromagnetic Wave Pulses by Electron Bunches Intersecting a Metal-Dielectric-Semiconductor Structure

Yu. O. Averkov
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine
Vladimir M. Yakovenko
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085

ABSTRACT

Transition radiation of surface electromagnetic pulses by a nonrelativistic electron bunch crossing a metal-dielectric-semiconductor structure has been investigated. The bunch is a rotation ellipsoid with uniform distribution of charge over the volume density and it moves along the normal to the structure from the direction of the metal. The dissipation of the radiation energy in the semiconductor is taken into account. It has been shown that the spectrum of transition radiation of surface waves has the form of a sequence of fastdecreasing oscillations. The appearance of maxima of the radiation spectrum density is stipulated by the fulfillment of some resonant ratios between the width of the dielectric layer, sizes of the bunch, the radiation wavelength, and the Van Kampen wavelength. It has been found that there are such values of the width of the dielectric layer at that the pulse energy and the coefficient of efficiency being equal to the ratio of the pulse energy to the total kinetic energy of electrons in the bunch, have the maximal vales.