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ISSN Print: 2572-4258
ISSN Online: 2572-4266
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IN-SITU STUDY OF SOLID-PHASE CONVERSIONS IN A TWO-LAYER FILM Cu/Se NANOSTRUCTURE
ABSTRACT
Experimental results of the in-situ study of solid-phase interaction of Cu and Se nanolayers deposited on glass substrates are presented. It is found that the lead time of solid-phase reactions in a two-layer film Cu/Se nanostructure strongly depends on the thickness of the selenium film. When the Se film has a thickness of 90 nm the solid-phase reaction is completed in 16 s, and with a thickness of 140 nm it is completed in 4 s. It is found that diffusion of Cu into the Se layer is observed at a Se film thickness of 140 nm and the avalanche-like solid-phase reaction with the formation of hexagonal CuSe (lattice parameters: a = 3.939 Å, c = 17.25 Å) is initiated.
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Kogai V. Ya., Vakhrushev A. V., Fedotov A. Yu., Spontaneous explosive crystallization and phase transformations in a selenium/copper bilayer nanofilm, JETP Letters, 95, 9, 2012. Crossref