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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v60.i56.140
10 pages

Parameters Measurements of Semimagnetic Semiconductors by Means of the Electron Paramagnetic Resonance Method

S. Yu. Karelin
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085, Ukraine

要約

The setup for measuring parameters of semiconductor compounds by means of the electron paramagnetic resonance method and measurement results of Cd1−xMnxTe-semimagnetic semiconductor parameters with the manganese concentration x varying from 0.1 to 0.45, have been represented.


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