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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v70.i13.20
pages 1133-1142

FORM BIREFRINGENCE CHARACTERISTICS OF DIELECTRIC SUBWAVELENGTH GRATINGS IN TERAHERTZ BAND

D. I. Kuleshov
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine
I. V. Shcherbatko
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine
M. S. Yanovsky
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, Ukraine

要約

Rigorous Coupled Wave Analysis was applied for simulation of effective refraction and birefringence coefficients for dielectric subwavelength gratings. As an example, the broadband quarter- and half-wave differential phase sections were calculated on the basis of dielectric grating in the range of 1.7...2.55 mm wavelength.


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