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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v72.i11.60
pages 997-1003

FEATURES OF THE MEASURING DEVICES USING REFLECTOMETERS FOR DETERMINING S PARAMETERS OF MICROWAVE FOUR-TERMINAL CIRCUITS

K. S. Korotkov
Kuban State University, Krasnodar, Russian Federation
D. N. Milchenko
OJSC "Ritm" , Krasnodar, Russian Federation

要約

The features of application of reflectometers for measuring complex S parameters of the tested microwave radio-measuring devices, as well as the impact of the measuring device S parameters based on the reflectometers on the measurement results are discussed.

参考

  1. Abubakirov, B. A., Gudkov, K. G., and Nechaev, E. V. , Measuring the Parameters of Radio Circuits.

  2. Feldshtein, A. L., Yavich, L. R., and Smirnov, V. P. , Reference Book on Elements of Waveguide Devices.

  3. http://www.eu.anritsu.com/files/reflectometer_an.pdf. Reflectometer. Measurements — Revisited. Application Note 2000.

  4. Silaev, M. A. and Bryantsev, E. F. , Application of Matrices and Graphs to Microwave Device Analysis.


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