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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v67.i20.80
pages 1871-1878

Electron-Wave Phenomena in the Composite Semiconductor Structure

D. V. Abdulkadyrov
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkiv 61085, Ukraine
E. M. Khutoryan
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine

要約

The interaction of an electromagnetic plane wave and a layered semiconductor-dielectric structure with a diffraction grating has been investigated. The reflection coefficients and the eigenvalues of the composite structure have been obtained. The results of the numerical experiments are given.


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