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Telecommunications and Radio Engineering
SJR: 0.203 SNIP: 0.44 CiteScore™: 1

ISSN 印刷: 0040-2508
ISSN オンライン: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v57.i5.90
9 pages

Determining the Antiferomagnetic Resonance Frequency in Semimagnetic Semiconductors by Means of Surface Polaritons

N. N. Beletskii
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085
S. A. Borysenko
A.Ya. Usikov Institute for Radiophysics and Electronics of the National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkiv 61085, Ukraine

要約

In the articles surface polaritons are investigated in semimagnetic semiconductors which are in a phase of antiferromagnetic ordering. The influence of the external static magnetic field and the electron concentration on the dispersion properties of the surface polaritons is determined. It is shown that the surface polaritons can have the dispersion independent of the direction of their propagation in the Voigt geometry. A new method based on excitation of the surface polaritons in the semimagnetic semiconductors is proposed for determination of the antiferromagnetic resonance frequency.


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