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International Journal of Fluid Mechanics Research
ESCI SJR: 0.206 SNIP: 0.446 CiteScore™: 0.5

ISSN 印刷: 2152-5102
ISSN オンライン: 2152-5110

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International Journal of Fluid Mechanics Research

DOI: 10.1615/InterJFluidMechRes.v27.i1.10
pages 1-12

Effect of Electrostatic Field on Rupture of Thin Micropolar Liquid Film

Rama Subba Reddy Gorla
Department of Mechanical Engineering, Cleveland State University, Cleveland, OH, 44115 USA; Department of Mechanical Engineering, University of Akron, Akron, Ohio 44325, USA; Department of Mechanical & Civil Engineering, Purdue University Northwest, Westville, IN 46391, USA
Earnest N. Poulos
Department of Mechanical Engineering Cleveland State University Cleveland, Ohio 44115, USA
Larry W. Byrd
Thermal Structures Branch, Air Vehicles Directorate, Air Force Research Laboratory, Wright Patterson Air Force Base, OH 45433, USA

要約

Nonlinear thin micropolar liquid film rupture has been analyzed by investigating the stability under the influence of a non-uniform electrostatic field to finite amplitude disturbances. The dynamics of the liquid film is formulated using the balance equations including a body force term due to van der Waals attractions. The effect of the electric field is included in the analysis only in the boundary condition at the liquid vapor interface. The governing equation for the film thickness was solved by finite difference method as part of an initial value problem for spatial periodic boundary conditions. The electric field stabilizes the film and increases the time to rupture when a long wavelength perturbation is introduced. The influence of material properties of the micropolar fluid on rapture is discussed.