RT Journal Article ID 207739c24238f8b6 A1 Ivanov, V. A. A1 Dvilyanskii, A. A. T1 Substantiation of the Criterion and Indicators of Functional Damage of Electronic Computing Devices JF Telecommunications and Radio Engineering JO TRE YR 2006 FD 2006-05-01 VO 65 IS 1-5 SP 61 OP 73 AB A method for calculating the criterion levels of damage of electronic computing devices affected by super-high frequency electromagnetic pulses is presented and substantiated. A model of formation of an electromagnetic pulse in the near and far zones is analyzed. A ratio for determining the criterion level of functional damage of electronic computing devices is obtained. PB Begell House LK https://www.dl.begellhouse.com/journals/0632a9d54950b268,37cff76f5929b04d,207739c24238f8b6.html