RT Journal Article
ID 55e45d5437215eb2
A1 Bin-Mansoor, S.
A1 Yilbas, Bekir S. 
T1 HEAT TRANSFER ACROSS SILICON−ALUMINUM−SILICON THIN FILMS DUE TO ULTRA−SHORT LASER PULSE IRRADIATION
JF Journal of Enhanced Heat Transfer
JO JEH(T)
YR 2012
FD 2012-04-25
VO 19
IS 3
SP 259
OP 270
K1 phonon transport
K1 silicon
K1 thin film
K1 aluminum
K1 thermal boundary resistance
AB Heat transfer across silicon−aluminum−silicon thin films due to ultrashort laser pulse irradiation is examined. Since silicon films are dielectric and do not have electrons in the conduction band, phonon radiative transport, based on the Boltzmann transport equation, is incorporated to predict equivalent equilibrium temperature in the silicon thin films. The modified two-equation model is used to account for the nonequilibrium ultrashort laser pulse heating in the aluminum film. The thermal boundary resistance is introduced at the interface of the films and the volumetric electron−phonon resistance is incorporated at the aluminum interfaces. The reflection, absorption, and transmittance of the incident beam by the thin films are determined using the matrix method. Temporal variation of equivalent equilibrium temperature in the silicon thin film is validated with the data presented in the previous study. It is found that the lattice phonon temperature in the aluminum film decays sharply toward the interface due to phonon transport to silicon film. The temperature jump at the silicon−aluminum first interface attains high values when the lattice phonon temperature at the aluminum interface is high.
PB Begell House
LK https://www.dl.begellhouse.com/journals/4c8f5faa331b09ea,237956664f293c41,55e45d5437215eb2.html