RT Journal Article
ID 5c149e576478f584
A1 Kogai, V. J.
A1 Vakhrushev, A. V.
T1 IN-SITU STUDY OF SOLID-PHASE CONVERSIONS IN A TWO-LAYER FILM Cu/Se NANOSTRUCTURE
JF Nanoscience and Technology: An International Journal
JO NST
YR 2011
FD 2011-05-10
VO 2
IS 1
SP 55
OP 60
K1 two-layer film nanostructure
K1 solid-phase reaction
K1 energy of elastic deformation
K1 relaxation
K1 diffusion
AB Experimental results of the in-situ study of solid-phase interaction of Cu and Se nanolayers deposited on glass substrates are presented. It is found that the lead time of solid-phase reactions in a two-layer film Cu/Se nanostructure strongly depends on the thickness of the selenium film. When the Se film has a thickness of 90 nm the solid-phase reaction is completed in 16 s, and with a thickness of 140 nm it is completed in 4 s. It is found that diffusion of Cu into the Se layer is observed at a Se film thickness of 140 nm and the avalanche-like solid-phase reaction with the formation of hexagonal CuSe (lattice parameters: a = 3.939 Å, c = 17.25 Å) is initiated.
PB Begell House
LK https://www.dl.begellhouse.com/journals/11e12455066dab5d,3cebacba2bcff7a8,5c149e576478f584.html