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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN Imprimir: 0040-2508
ISSN On-line: 1943-6009

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Telecommunications and Radio Engineering

DOI: 10.1615/TelecomRadEng.v53.i9-10.100
pages 79-89

The Casimir Attraction Between Thin Metal Films

V. N. Dubrava
Institute of Radio Physics and Electronics, national Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085, Ukraine
V. A. Yampol'skii
O.Ya. Usikov Institute for Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12 Academician Proskura St., Kharkiv 61085, Ukraine; V. Karazin National University of Kharkiv, 4 Svobody Sq., Kharkiv 61022, Ukraine
O. I. Lyubimov
A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine 12, Academician Proskura St., Kharkov 61085, Ukraine

RESUMO

The effect of the electronic properties of thin films on the Casimir attractive force between them is studied theoretically. In the low-temperature limit, where the film interaction is mainly due to vacuum fluctuations of the electromagnetic field, a closed analytic expression has been derived for the Casimir force as a function of the film thickness, d; their separation, a, and the skin depth, δ, at a certain characteristic frequency. For thin films with d << δ, asymptotic expressions for the Casimir force that correspond to the frequency conditions of the normal and “infrared” skin-effects have been derived. A possibility in principle of studying the electronic properties of films through Casimir force measurements is demonstrated.


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