Inscrição na biblioteca: Guest
Portal Digital Begell Biblioteca digital da Begell eBooks Diários Referências e Anais Coleções de pesquisa
High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes
SJR: 0.137 SNIP: 0.341 CiteScore™: 0.43

ISSN Imprimir: 1093-3611
ISSN On-line: 1940-4360

High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes

DOI: 10.1615/HighTempMatProc.v11.i3.120
pages 455-465

MEASURING ELECTRIC FIELDS WITH LASER-INDUCED FLUORESCENCE-DIP STARK SPECTROSCOPY

E. Wagenaars
Dept. of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, Netherlands
M.D. Bowden
Department of Physics and Astronomy, The Open University, Milton Keynes, MK7 6AA, United Kingdom
G. M. W. Kroesen
Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands

RESUMO

The electric field is an important quantity in low-pressure gas discharges, driving many fundamental processes. Unfortunately, it is difficult to measure electric field distributions in plasmas directly. The goal of this research was to develop a diagnostic technique to measure electric fields in low-pressure xenon discharges. It was based on measuring Stark effects in Rydberg levels of xenon atoms by laser-induced fluorescence-dip spectroscopy. With our experimental arrangement we could measure electric fields ranging from 1000 to 4000 V/cm with an accuracy between 150 and 300 V/cm.