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International Journal for Multiscale Computational Engineering

Publicou 6 edições por ano

ISSN Imprimir: 1543-1649

ISSN On-line: 1940-4352

The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) IF: 1.4 To calculate the five year Impact Factor, citations are counted in 2017 to the previous five years and divided by the source items published in the previous five years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) 5-Year IF: 1.3 The Immediacy Index is the average number of times an article is cited in the year it is published. The journal Immediacy Index indicates how quickly articles in a journal are cited. Immediacy Index: 2.2 The Eigenfactor score, developed by Jevin West and Carl Bergstrom at the University of Washington, is a rating of the total importance of a scientific journal. Journals are rated according to the number of incoming citations, with citations from highly ranked journals weighted to make a larger contribution to the eigenfactor than those from poorly ranked journals. Eigenfactor: 0.00034 The Journal Citation Indicator (JCI) is a single measurement of the field-normalized citation impact of journals in the Web of Science Core Collection across disciplines. The key words here are that the metric is normalized and cross-disciplinary. JCI: 0.46 SJR: 0.333 SNIP: 0.606 CiteScore™:: 3.1 H-Index: 31

Indexed in

Effects of Externally Applied Stress on the Properties of Quantum Dot Nanostructures

Volume 1, Edição 1, 2003, 9 pages
DOI: 10.1615/IntJMultCompEng.v1.i1.40
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RESUMO

An array of semiconductor quantum dots is studied computationally using an approach that couples linear elasticity to electronic and optical properties. The effect of strain on the photoemission behavior of the quantum dot array is of particular interest. With a realistic quantum dot array morphology as input, finite element analysis is first used to compute electron energy levels in the domain. From these energy levels, optical conductivity is computed for the system, which is directly comparable with experimental optical absorption and emission spectra. Then, to simulate the effect of microscope tip-sample interaction, the strain field associated with a rigid cylindrical indenter is superimposed on the sample and the calculation is performed again. The computed optical spectrum shows a distinct blue shift as a result of the indentation strain field. This observation is qualitatively and quantitatively in agreement with near field scanning optical microscopy (NSOM) experiments on the same material system. The result shows that in nanoscale semiconductor devices, mechanical and electronic properties are coupled over the same length scales and can be treated together in a coupled continuum finite element formulation.

CITADO POR
  1. Liang Yuan-Hua, Ohashi Masane, Arai Yoshio, Ozasa Kazunari, Location of quantum dots identified by microscopic photoluminescence changes during nanoprobe indentation with a horizontal scan, Physical Review B, 75, 19, 2007. Crossref

  2. Michopoulos John G., Farhat Charbel, Fish Jacob, Modeling and Simulation of Multiphysics Systems, Journal of Computing and Information Science in Engineering, 5, 3, 2005. Crossref

  3. Fish Jacob, Bridging the scales in nano engineering and science, Journal of Nanoparticle Research, 8, 5, 2006. Crossref

  4. Fish Jacob, Chen Wen, Discrete-to-continuum bridging based on multigrid principles, Computer Methods in Applied Mechanics and Engineering, 193, 17-20, 2004. Crossref

  5. Liang Yuan-Hua, Arai Yoshio, Ozasa Kazunari, Ohashi Masane, Tsuchida Eiichiro, Simultaneous measurement of nanoprobe indentation force and photoluminescence of InGaAs/GaAs quantum dots and its simulation, Physica E: Low-dimensional Systems and Nanostructures, 36, 1, 2007. Crossref

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