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ISSN Печать: 0040-2508
ISSN Онлайн: 1943-6009
Indexed in
Accuracy and Sensitivity of Surface Resistance Measurements of High-Temperature Superconductor Films Using Quasioptical Dielectric Resonators
Краткое описание
The most probable measurement error analysis of the surface resistance Rs of high-temperature superconductor (HTS) films using quasioptical dielectric resonators has been carried out depending on the resonator main operating characteristics and dielectric properties. It has been shown that using the quasioptical dielectric resonator made of single crystal leukosapphire one can achieve the extremely low values of the measurement error and the most high measurement sensitivity of the surface resistance Rs at low temperatures. Numerical evaluations are presented for the 8-mm wavelength range. In partially, the minimal measurable value Rsmin (Rsmin < 1 μΩ at T < 4.2 K) based on the sapphire single crystal properties and operating characteristics of modern microwave network-analyzers has been obtained.