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Telecommunications and Radio Engineering
SJR: 0.202 SNIP: 0.2 CiteScore™: 0.23

ISSN Печать: 0040-2508
ISSN Онлайн: 1943-6009

Выпуски:
Том 78, 2019 Том 77, 2018 Том 76, 2017 Том 75, 2016 Том 74, 2015 Том 73, 2014 Том 72, 2013 Том 71, 2012 Том 70, 2011 Том 69, 2010 Том 68, 2009 Том 67, 2008 Том 66, 2007 Том 65, 2006 Том 64, 2005 Том 63, 2005 Том 62, 2004 Том 61, 2004 Том 60, 2003 Том 59, 2003 Том 58, 2002 Том 57, 2002 Том 56, 2001 Том 55, 2001 Том 54, 2000 Том 53, 1999 Том 52, 1998 Том 51, 1997

Telecommunications and Radio Engineering

Купить выпуск $197.00 Том 55, 2001 Выпуск 9

DOI: 10.1615/TelecomRadEng.v55.i9

Содержание:

Multimode Excitation of Antennas
M. A. Omarov
8 pages
DOI: 10.1615/TelecomRadEng.v55.i9.10
Characteristic and Reciprocal Conductivities of Slit Radiators on a Perfectly Conducting Sphere
Yu. M. Penkin, R. I. Klimovich
8 pages
DOI: 10.1615/TelecomRadEng.v55.i9.20
Cavity Backed Narrow Slot: TE-wave case
A.V. Sulima
6 pages
DOI: 10.1615/TelecomRadEng.v55.i9.50
Behavior of Eigenfrequencies in a Plasma-Filled Resonator
P. N. Melezhik
10 pages
DOI: 10.1615/TelecomRadEng.v55.i9.60
A New Approach to Safety Estimation of the Low-Level Microwave Radiation
T. N. Sulima, Anatoly Ivanovich Fisun
10 pages
DOI: 10.1615/TelecomRadEng.v55.i9.70
Dynamic Processes in the Substances of Polarized Nuclear Targets
I. V. Ivanchenko, S. Yu. Karelin, N. A. Popenko
10 pages
DOI: 10.1615/TelecomRadEng.v55.i9.80
Properties of Photoconverters with Active Layer of Cadmium Telluride Containing an lsovalent Impurity of Oxygen
Victor P. Makhniy, M. V. Demych
3 pages
DOI: 10.1615/TelecomRadEng.v55.i9.90
Hole-Electron Phenomena in the p+p Diode
A. N. Shekhovtsov, N. A. Shekhovtsov
12 pages
DOI: 10.1615/TelecomRadEng.v55.i9.100
Photoelectric Silicon Film Transducers Produced by Magnetron Sputtering
A. C. Mazinov, A. V. Karavaynikov
6 pages
DOI: 10.1615/TelecomRadEng.v55.i9.110
Prospects for Development of Silicon Photoconverters and Batteries for Space Use
A.P. Gorban, V.P. Kostylov, V. N. Borshchov, A. M. Listratenko
7 pages
DOI: 10.1615/TelecomRadEng.v55.i9.120