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Портал Begell Электронная Бибилиотека e-Книги Журналы Справочники и Сборники статей Коллекции
Nanoscience and Technology: An International Journal
ESCI SJR: 1.031 SNIP: 1.517 CiteScore™: 0.7

ISSN Печать: 2572-4258
ISSN Онлайн: 2572-4266

Nanoscience and Technology: An International Journal

Ранее издавался как Nanomechanics Science and Technology: An International Journal

DOI: 10.1615/NanomechanicsSciTechnolIntJ.v2.i1.40
pages 55-60

IN-SITU STUDY OF SOLID-PHASE CONVERSIONS IN A TWO-LAYER FILM Cu/Se NANOSTRUCTURE

V. J. Kogai
Institute of Applied Mechanics, Ural Branch of the Russian Academy of Sciences, Izhevsk, Russia
A. V. Vakhrushev
Institute of Mechanics, Ural Branch of the Russian Academy of Sciences, Izhevsk, Russia; Kalashnikov Izhevsk State Technical University, Izhevsk, Russia

Краткое описание

Experimental results of the in-situ study of solid-phase interaction of Cu and Se nanolayers deposited on glass substrates are presented. It is found that the lead time of solid-phase reactions in a two-layer film Cu/Se nanostructure strongly depends on the thickness of the selenium film. When the Se film has a thickness of 90 nm the solid-phase reaction is completed in 16 s, and with a thickness of 140 nm it is completed in 4 s. It is found that diffusion of Cu into the Se layer is observed at a Se film thickness of 140 nm and the avalanche-like solid-phase reaction with the formation of hexagonal CuSe (lattice parameters: a = 3.939 Å, c = 17.25 Å) is initiated.


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