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International Journal for Multiscale Computational Engineering

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ISSN Печать: 1543-1649

ISSN Онлайн: 1940-4352

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Hybrid Model for Simulation of Magneto-Optical Response of Layers of Semiconductor Nano-Objects

Том 8, Выпуск 2, 2010, pp. 195-205
DOI: 10.1615/IntJMultCompEng.v8.i2.50
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Краткое описание

In this paper a multiscale hybrid model for evaluation of the collective magnetooptical response of semiconductor nano-object systems is presented. The model is based on a modification of the discrete dipole approximation and can efficiently describe the response from systems of arbitrary-shaped nano-objects embedded into a host semiconductor. The approach requires a simultaneous multiscale electrodynamic and quantum mechanical description. As an example of the model implementation, simulation of the magneto-ellipsometry of a layer of embedded semiconductor triple quantum dot molecules was performed. It was demonstrated that the model can be used to reproduce from conventional ellipsometric data important information on the quantum mechanics of the semiconductor nano-objects.

Ключевые слова: quantum dot molecule, semiconductor, magneto-optics
ЛИТЕРАТУРА
  1. Avelin, J., Polarizability Analysis of Canonical Dielectric and Bi-Anisotropic Scatterers.

  2. Bastard, G., Wave Mechanics Applied to Semiconductor Heterostructures.

  3. Boxberg, F. and Tulkki, J., Theory of the electronic structure and carrier dynamics of strain-induced (Ga,In) As quantum dots. DOI: 10.1088/0034-4885/70/8/R04

  4. Chuang, S. L., Physics of Optoelectronic Devices.

  5. Draine, B. T. and Flatau, P. J., Discrete-dipole approximation for periodic targets: Theory and tests. DOI: 10.1364/JOSAA.25.002693

  6. Eliseev, P. G., Li, H., Stintz, A., Liu, G. T., Newell, T. C., Malloy, K. J., and Lester, L. F., Transition dipole moment of InAs/InGaAs quantum dots from experiments on ultralow-threshold laser diodes. DOI: 10.1063/1.126944

  7. Kammerer, C., Sauvage, S., Fishman, G., Boucaud, P., Patriarche, G., and Lemaitre, A., Mid-infrared Intersublevel Absorption of Vertically Electronically Coupled InAs Quantum Dots. DOI: 10.1063/1.2117621

  8. Li, Y., Voskoboynikov, O., Lee, C. P., Sze, S. M., and Tretyak, O., Electron energy state dependence on the shape and size of semiconductor quantum dots. DOI: 10.1063/1.1412578

  9. Press, W. H., Teukolsky, B. P., Vetterling, W. T., and Flannery, S. A., Numerical Recipes 3rd Edition: The Art of Scientific Computing.

  10. Pryor, C. E. and Pistol, M. E., Band-edge diagrams for strained III-V semiconductor quantum wells wires, and dots. DOI: 10.1103/PhysRevB.72.205311

  11. Reimann, S. M. and Maninen, M., Electronic structure of quantum dots.

  12. Sihvola, A., Yla-Oijala, P., Jarvenpaa, S., and Avelin, J., Polarizabilities of platonic solids. DOI: 10.1109/TAP.2004.834081

  13. Smith, D. R., Pendry, J. B., and Wiltshire, M. C. K., Metamaterials and negative refractive index. DOI: 10.1126/science.1096796

  14. Tompkins, H. and Irene, E. A., Eds. Handbook of Ellipsometry.

  15. Velesago, V. G., The Electrodynamics of Substances with Simultaneously Negative Values of ε and μ. DOI: 10.1070/PU1968v010n04ABEH003699

  16. Vlieger, J., Reflection and transmission of light by a square monpolar lattice.

  17. Voskoboynikov, O., Li, Y. M., Lu, H. M., Shih, C.-F., and Lee, C. P., Energy states and magnetization in nanoscale quantum rings. DOI: 10.1103/PhysRevB.66.155306

  18. Voskoboynikov, O., Wijers, C. M. J., Liu, J. L., and Lee, C. P., Magneto-optical response of layers of semiconductor quantum dots and nanorings. DOI: 10.1103/PhysRevB.71.245332

  19. Voskoboynikov, O., Theory of diamagnetism in an asymmetrical vertical quantum dot molecule. DOI: 10.1103/PhysRevB.78.113310

  20. Vurgaftman, I., Meyer, J. R., and Ram-Mohan, L. R., Band parameters for III-V compound semiconductor and their alloys. DOI: 10.1063/1.1368156

  21. Wijers, C. M. J., and Emmett, K. M. E., Structural contribution to the anisotropic reflection from the Si (110) surface. DOI: 10.1088/0031-8949/38/3/017

  22. Wijers, C. M. J., Polarizability tensor and Kramers-Heisenberg induction. DOI: 10.1103/PhysRevA.70.063807

  23. Wijers, C. M. J., Chu, J. H., Liu, J. L., and Voskoboynikov, O., Optical Response of Layers of Embedded Semiconductor Quantum Dots. DOI: 10.1103/PhysRevB.74.035323

  24. Yurkin, M. A. and Hoekstra, A. G., The discrete dipole approximation: An overview and recent developments. DOI: 10.1016/j.jqsrt.2007.01.034

ЦИТИРОВАНО В
  1. Su Sheng-Kai, Li Liang-Chen, Suen Yuen-Wuu, Wu Jau-Yang, Kuo Hong-Rong, Sung Yu-Tai, Lee Chien-Ping, Voskoboynikov Oleksandr, Low temperature and high magnetic field spectroscopic ellipsometry system, Review of Scientific Instruments, 85, 5, 2014. Crossref

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