每年出版 12 期
ISSN 打印: 0040-2508
ISSN 在线: 1943-6009
Indexed in
EXPERIMENTAL RESEARCH OF DIFFRACTION PROPERTIES OF THIN CONDUCTING FILMS IN A WAVEGUIDE
摘要
The results of experimental researches of reflection, passing and absorption of electromagnetic waves in the thin films of copper, aluminum and nichrome are presented in the range of wave lengths of 2...10 cm. The analysis of the results shows that reflection factors decrease as far as the film thickness decreases. The film structure acts more on the reflection factors values than film material permittivity. The transit factor behavior in the thin films is determined by the electromagnetic wave absorption, the size of which depends nonlinear on the thickness and is determined by the technology and a number of other factors. The absorption increases largely for the films whose thickness is less than 50 nm.
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