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Radio Physics and Radio Astronomy

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ISSN Druckformat: 2152-274X

ISSN Online: 2152-2758

A MICROWAVE TECHNIQUE FOR DETERMINING THICKNESSES OF DIELECTRIC MATERIALS USING RADIATORS WITH SCANNING DIRECTIONAL PATTERNS

Volumen 2, Ausgabe 2, 2011, pp. 189-196
DOI: 10.1615/RadioPhysicsRadioAstronomy.v2.i2.120
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ABSTRAKT

Capabilities of microwave metrology are analyzed as for determining thicknesses of planar layers of dielectric nonmagnetic materials placed either on a metal substrate or in free space. The radiating system represents a short-circuited double-arm section of a dielectric waveguide and a dielectric plate electrodynamically coupled with it. Estimates of errors of measuring the thickness and permittivity of the analyzed layer are presented.

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