Publication de 12 numéros par an
ISSN Imprimer: 0040-2508
ISSN En ligne: 1943-6009
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ELLIPSOIDAL PROPERTIES OF THE REFLECTION FACTORS FROM A THIN-LAYER PERIODIC SEMICONDUCTOR- DIELECTRIC STRUCTURE IN A MAGNETIC FIELD
RÉSUMÉ
Electromagnetic wave polarization is analyzed in the case of reflection from a thin-stratified semiconductor-dielectric periodic structure situated on a metal substrate in an external magnetic field. It is shown that the polarization ellipse parameters, specifically, the length and angle of inclination of the ellipse axes with respect to the coordinate frame axes are dependent on the magnetic field strength and frequency and angle of electromagnetic wave incidence. Owing to specific properties of the permittivity tensor of the thin layered structure a number of peculiarities appear in the dependences of the phase difference on the structure parameters. The results obtained with allowance made for losses in the semiconductor material are characterized by smoother dependences and show no sharp changes in the polarization characteristics as the external magnetic field and/or electromagnetic wave frequency are changed
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Trofimenko Faina, Fedorin Illia, Polarization conversion by a magnetic metamaterial on a substrate, 2015 International Young Scientists Forum on Applied Physics (YSF), 2015. Crossref