ライブラリ登録: Guest
International Journal for Multiscale Computational Engineering

年間 6 号発行

ISSN 印刷: 1543-1649

ISSN オンライン: 1940-4352

The Impact Factor measures the average number of citations received in a particular year by papers published in the journal during the two preceding years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) IF: 1.4 To calculate the five year Impact Factor, citations are counted in 2017 to the previous five years and divided by the source items published in the previous five years. 2017 Journal Citation Reports (Clarivate Analytics, 2018) 5-Year IF: 1.3 The Immediacy Index is the average number of times an article is cited in the year it is published. The journal Immediacy Index indicates how quickly articles in a journal are cited. Immediacy Index: 2.2 The Eigenfactor score, developed by Jevin West and Carl Bergstrom at the University of Washington, is a rating of the total importance of a scientific journal. Journals are rated according to the number of incoming citations, with citations from highly ranked journals weighted to make a larger contribution to the eigenfactor than those from poorly ranked journals. Eigenfactor: 0.00034 The Journal Citation Indicator (JCI) is a single measurement of the field-normalized citation impact of journals in the Web of Science Core Collection across disciplines. The key words here are that the metric is normalized and cross-disciplinary. JCI: 0.46 SJR: 0.333 SNIP: 0.606 CiteScore™:: 3.1 H-Index: 31

Indexed in

MULTISCALE MICROMORPHIC MODEL FOR THE PLASTIC RESPONSE OF CU THIN FILM

巻 11, 発行 1, 2013, pp. 45-57
DOI: 10.1615/IntJMultCompEng.2012003172
Get accessGet access

要約

In this article, the multiscale micromorphic plasticity model is employed to quantitatively investigate the size and Bauschinger effects of freestanding Cu thin films in a continuum sense. The simulations, including the single-layer and multi-layer models, are carried out within a two-dimensional plane strain framework with the passivation layer modeled as the higher-order boundary condition. The computational results are compared with the experimental data of two sets of films consisting of the electroplated and sputtered films. It is found that for the electroplated films, the effects of film thickness are in quite good consistent with the experimental data. The strengthening factor charactering the passivation effect agrees well with the experiments for both the electroplated and sputtered films. The boundary layers near the internal interfaces (grain boundaries or film-passivation layers) are captured. The accumulation of the backstress scales almost linearly with the pre-strain. In the multi-layer polycrystal model, the yield strength of electroplated films obeys a nonlinear dependence on grain boundary density.

Begell Digital Portal Begellデジタルライブラリー 電子書籍 ジャーナル 参考文献と会報 リサーチ集 価格及び購読のポリシー Begell House 連絡先 Language English 中文 Русский Português German French Spain